APA (7th ed.) Citation

L, V., CM, G., TA, M., B, P., D, P., E, M., . . . S, W. (2018). Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography. Nano letters, 18(6), 3449. https://doi.org/10.1021/acs.nanolett.8b00458

Chicago Style (17th ed.) Citation

L, Vidas, et al. "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography." Nano Letters 18, no. 6 (2018): 3449. https://doi.org/10.1021/acs.nanolett.8b00458.

MLA (9th ed.) Citation

L, Vidas, et al. "Imaging Nanometer Phase Coexistence at Defects During the Insulator-Metal Phase Transformation in VO2 Thin Films by Resonant Soft X-ray Holography." Nano Letters, vol. 18, no. 6, 2018, p. 3449, https://doi.org/10.1021/acs.nanolett.8b00458.