| Authors: |
Kwon S; Department of Internal Medicine, Seoul National University Hospital, Seoul, Republic of Korea., Hong J; School of Electrical Engineering, KAIST, Daejeon, Republic of Korea., Choi EK; Department of Internal Medicine, Seoul National University Hospital, Seoul, Republic of Korea., Lee E; Department of Internal Medicine, Seoul National University Hospital, Seoul, Republic of Korea., Hostallero DE; School of Electrical Engineering, KAIST, Daejeon, Republic of Korea., Kang WJ; School of Electrical Engineering, KAIST, Daejeon, Republic of Korea., Lee B; Sky Labs Inc, Seongnam, Republic of Korea., Jeong ER; Department of Information and Communication Engineering, Hanbat National University, Daejeon, Republic of Korea., Koo BK; Department of Internal Medicine, Seoul National University Hospital, Seoul, Republic of Korea., Oh S; Department of Internal Medicine, Seoul National University Hospital, Seoul, Republic of Korea., Yi Y; School of Electrical Engineering, KAIST, Daejeon, Republic of Korea. |