RW, A., C, J., MD, R., AM, J., SD, H., MP, J., . . . MG, B. (2019). Quantifying error and leakage in an encoded Si/SiGe triple-dot qubit. Nature nanotechnology, 14(8), 747. https://doi.org/10.1038/s41565-019-0500-4
Chicago Style (17th ed.) CitationRW, Andrews, et al. "Quantifying Error and Leakage in an Encoded Si/SiGe Triple-dot Qubit." Nature Nanotechnology 14, no. 8 (2019): 747. https://doi.org/10.1038/s41565-019-0500-4.
MLA (9th ed.) CitationRW, Andrews, et al. "Quantifying Error and Leakage in an Encoded Si/SiGe Triple-dot Qubit." Nature Nanotechnology, vol. 14, no. 8, 2019, p. 747, https://doi.org/10.1038/s41565-019-0500-4.
Warning: These citations may not always be 100% accurate.