| Authors: |
Mandal S, Yuan C; Center for Device Thermography and Reliability , University of Bristol , Bristol BS8 1TL , U.K., Massabuau F; Department of Materials Science & Metallurgy , University of Cambridge , Cambridge CB3 0FS , U.K., Pomeroy JW; Center for Device Thermography and Reliability , University of Bristol , Bristol BS8 1TL , U.K., Cuenca J, Bland H, Thomas E, Wallis D; Department of Materials Science & Metallurgy , University of Cambridge , Cambridge CB3 0FS , U.K., Batten T; Renishaw plc. , Wotton-under-Edge GL12 7DW , U.K., Morgan D; Cardiff Catalysis Institute, School of Chemistry , Cardiff University , Cardiff CF10 3AT , U.K., Oliver R; Department of Materials Science & Metallurgy , University of Cambridge , Cambridge CB3 0FS , U.K., Kuball M; Center for Device Thermography and Reliability , University of Bristol , Bristol BS8 1TL , U.K., Williams OA |
