Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength.

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Title: Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength.
Authors: Suratwala T, Steele R, Destino J, Wong L, Norton M, Laurence T, Aracne-Ruddle C, Miller P, Shen N, Feit M, Ray N, Carr W, Rivers C, Peters V, Jeppson S, Malone D, Greene W
Source: Applied optics [Appl Opt] 2020 Feb 20; Vol. 59 (6), pp. 1602-1610.
Publication Type: Journal Article
Journal Info: Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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PubType: Academic Journal
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  Data: Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength.
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  Data: <searchLink fieldCode="AU" term="%22Suratwala+T%22">Suratwala T</searchLink><br /><searchLink fieldCode="AU" term="%22Steele+R%22">Steele R</searchLink><br /><searchLink fieldCode="AU" term="%22Destino+J%22">Destino J</searchLink><br /><searchLink fieldCode="AU" term="%22Wong+L%22">Wong L</searchLink><br /><searchLink fieldCode="AU" term="%22Norton+M%22">Norton M</searchLink><br /><searchLink fieldCode="AU" term="%22Laurence+T%22">Laurence T</searchLink><br /><searchLink fieldCode="AU" term="%22Aracne-Ruddle+C%22">Aracne-Ruddle C</searchLink><br /><searchLink fieldCode="AU" term="%22Miller+P%22">Miller P</searchLink><br /><searchLink fieldCode="AU" term="%22Shen+N%22">Shen N</searchLink><br /><searchLink fieldCode="AU" term="%22Feit+M%22">Feit M</searchLink><br /><searchLink fieldCode="AU" term="%22Ray+N%22">Ray N</searchLink><br /><searchLink fieldCode="AU" term="%22Carr+W%22">Carr W</searchLink><br /><searchLink fieldCode="AU" term="%22Rivers+C%22">Rivers C</searchLink><br /><searchLink fieldCode="AU" term="%22Peters+V%22">Peters V</searchLink><br /><searchLink fieldCode="AU" term="%22Jeppson+S%22">Jeppson S</searchLink><br /><searchLink fieldCode="AU" term="%22Malone+D%22">Malone D</searchLink><br /><searchLink fieldCode="AU" term="%22Greene+W%22">Greene W</searchLink>
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  Data: <searchLink fieldCode="JN" term="%220247660%22">Applied optics</searchLink> [Appl Opt] 2020 Feb 20; Vol. 59 (6), pp. 1602-1610.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Optica+Publishing+Group%22">Optica Publishing Group </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>0247660 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1539-4522 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%221559128X%22">1559128X </searchLink><i>NLM ISO Abbreviation: </i>Appl Opt <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1364/AO.381739
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      – Code: eng
        Text: English
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        StartPage: 1602
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              Text: 2020 Feb 20
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