Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength.
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| Title: | Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength. |
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| Authors: | Suratwala T, Steele R, Destino J, Wong L, Norton M, Laurence T, Aracne-Ruddle C, Miller P, Shen N, Feit M, Ray N, Carr W, Rivers C, Peters V, Jeppson S, Malone D, Greene W |
| Source: | Applied optics [Appl Opt] 2020 Feb 20; Vol. 59 (6), pp. 1602-1610. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Optica Publishing Group Country of Publication: United States NLM ID: 0247660 Publication Model: Print Cited Medium: Internet ISSN: 1539-4522 (Electronic) Linking ISSN: 1559128X NLM ISO Abbreviation: Appl Opt Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 32225658 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Suratwala+T%22">Suratwala T</searchLink><br /><searchLink fieldCode="AU" term="%22Steele+R%22">Steele R</searchLink><br /><searchLink fieldCode="AU" term="%22Destino+J%22">Destino J</searchLink><br /><searchLink fieldCode="AU" term="%22Wong+L%22">Wong L</searchLink><br /><searchLink fieldCode="AU" term="%22Norton+M%22">Norton M</searchLink><br /><searchLink fieldCode="AU" term="%22Laurence+T%22">Laurence T</searchLink><br /><searchLink fieldCode="AU" term="%22Aracne-Ruddle+C%22">Aracne-Ruddle C</searchLink><br /><searchLink fieldCode="AU" term="%22Miller+P%22">Miller P</searchLink><br /><searchLink fieldCode="AU" term="%22Shen+N%22">Shen N</searchLink><br /><searchLink fieldCode="AU" term="%22Feit+M%22">Feit M</searchLink><br /><searchLink fieldCode="AU" term="%22Ray+N%22">Ray N</searchLink><br /><searchLink fieldCode="AU" term="%22Carr+W%22">Carr W</searchLink><br /><searchLink fieldCode="AU" term="%22Rivers+C%22">Rivers C</searchLink><br /><searchLink fieldCode="AU" term="%22Peters+V%22">Peters V</searchLink><br /><searchLink fieldCode="AU" term="%22Jeppson+S%22">Jeppson S</searchLink><br /><searchLink fieldCode="AU" term="%22Malone+D%22">Malone D</searchLink><br /><searchLink fieldCode="AU" term="%22Greene+W%22">Greene W</searchLink> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%220247660%22">Applied optics</searchLink> [Appl Opt] 2020 Feb 20; Vol. 59 (6), pp. 1602-1610. – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Optica+Publishing+Group%22">Optica Publishing Group </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>0247660 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1539-4522 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%221559128X%22">1559128X </searchLink><i>NLM ISO Abbreviation: </i>Appl Opt <i>Subsets: </i>MEDLINE; PubMed not MEDLINE |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=32225658 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1364/AO.381739 Languages: – Code: eng Text: English PhysicalDescription: Pagination: StartPage: 1602 Titles: – TitleFull: Sapphire advanced mitigation process: wet etch to expose sub-surface damage and increase laser damage resistance and mechanical strength. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Suratwala T – PersonEntity: Name: NameFull: Steele R – PersonEntity: Name: NameFull: Destino J – PersonEntity: Name: NameFull: Wong L – PersonEntity: Name: NameFull: Norton M – PersonEntity: Name: NameFull: Laurence T – PersonEntity: Name: NameFull: Aracne-Ruddle C – PersonEntity: Name: NameFull: Miller P – PersonEntity: Name: NameFull: Shen N – PersonEntity: Name: NameFull: Feit M – PersonEntity: Name: NameFull: Ray N – PersonEntity: Name: NameFull: Carr W – PersonEntity: Name: NameFull: Rivers C – PersonEntity: Name: NameFull: Peters V – PersonEntity: Name: NameFull: Jeppson S – PersonEntity: Name: NameFull: Malone D – PersonEntity: Name: NameFull: Greene W IsPartOfRelationships: – BibEntity: Dates: – D: 20 M: 02 Text: 2020 Feb 20 Type: published Y: 2020 Identifiers: – Type: issn-electronic Value: 1539-4522 Numbering: – Type: volume Value: 59 – Type: issue Value: 6 Titles: – TitleFull: Applied optics Type: main |
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