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Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.

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Title: Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.
Authors: Aryana K; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Gaskins JT; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Nag J; Western Digital Corporation, San Jose, CA, 95119, USA., Stewart DA; Western Digital Corporation, San Jose, CA, 95119, USA., Bai Z; Western Digital Corporation, San Jose, CA, 95119, USA., Mukhopadhyay S; NRC Research Associate at Naval Research Laboratory, Washington, DC, 20375, USA., Read JC; Western Digital Corporation, San Jose, CA, 95119, USA., Olson DH; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Hoglund ER; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Howe JM; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Giri A; Department of Mechanical, Industrial and Systems Engineering, University of Rhode Island, Kingston, RI, 02881, USA., Grobis MK; Western Digital Corporation, San Jose, CA, 95119, USA., Hopkins PE; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Physics, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.
Source: Nature communications [Nat Commun] 2021 Feb 03; Vol. 12 (1), pp. 774. Date of Electronic Publication: 2021 Feb 03.
Publication Type: Journal Article
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.
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  Data: <searchLink fieldCode="AU" term="%22Aryana+K%22">Aryana K</searchLink>; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA.<br /><searchLink fieldCode="AU" term="%22Gaskins+JT%22">Gaskins JT</searchLink>; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA.<br /><searchLink fieldCode="AU" term="%22Nag+J%22">Nag J</searchLink>; Western Digital Corporation, San Jose, CA, 95119, USA.<br /><searchLink fieldCode="AU" term="%22Stewart+DA%22">Stewart DA</searchLink>; Western Digital Corporation, San Jose, CA, 95119, USA.<br /><searchLink fieldCode="AU" term="%22Bai+Z%22">Bai Z</searchLink>; Western Digital Corporation, San Jose, CA, 95119, USA.<br /><searchLink fieldCode="AU" term="%22Mukhopadhyay+S%22">Mukhopadhyay S</searchLink>; NRC Research Associate at Naval Research Laboratory, Washington, DC, 20375, USA.<br /><searchLink fieldCode="AU" term="%22Read+JC%22">Read JC</searchLink>; Western Digital Corporation, San Jose, CA, 95119, USA.<br /><searchLink fieldCode="AU" term="%22Olson+DH%22">Olson DH</searchLink>; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA.<br /><searchLink fieldCode="AU" term="%22Hoglund+ER%22">Hoglund ER</searchLink>; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA.<br /><searchLink fieldCode="AU" term="%22Howe+JM%22">Howe JM</searchLink>; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA.<br /><searchLink fieldCode="AU" term="%22Giri+A%22">Giri A</searchLink>; Department of Mechanical, Industrial and Systems Engineering, University of Rhode Island, Kingston, RI, 02881, USA.<br /><searchLink fieldCode="AU" term="%22Grobis+MK%22">Grobis MK</searchLink>; Western Digital Corporation, San Jose, CA, 95119, USA.<br /><searchLink fieldCode="AU" term="%22Hopkins+PE%22">Hopkins PE</searchLink>; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Physics, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.
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  Data: <searchLink fieldCode="JN" term="%22101528555%22">Nature communications</searchLink> [Nat Commun] 2021 Feb 03; Vol. 12 (1), pp. 774. <i>Date of Electronic Publication: </i>2021 Feb 03.
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