Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.

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Bibliographic Details
Title: Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices.
Authors: Aryana K; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Gaskins JT; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Nag J; Western Digital Corporation, San Jose, CA, 95119, USA., Stewart DA; Western Digital Corporation, San Jose, CA, 95119, USA., Bai Z; Western Digital Corporation, San Jose, CA, 95119, USA., Mukhopadhyay S; NRC Research Associate at Naval Research Laboratory, Washington, DC, 20375, USA., Read JC; Western Digital Corporation, San Jose, CA, 95119, USA., Olson DH; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Hoglund ER; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Howe JM; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA., Giri A; Department of Mechanical, Industrial and Systems Engineering, University of Rhode Island, Kingston, RI, 02881, USA., Grobis MK; Western Digital Corporation, San Jose, CA, 95119, USA., Hopkins PE; Department of Mechanical and Aerospace Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.; Department of Physics, University of Virginia, Charlottesville, VA, 22904, USA. peh4v@virginia.edu.
Source: Nature communications [Nat Commun] 2021 Feb 03; Vol. 12 (1), pp. 774. Date of Electronic Publication: 2021 Feb 03.
Publication Type: Journal Article
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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