APA (7th ed.) Citation

CS, O., T, D., LS, O., G, W., AA, W., S, S., . . . HS, S. (2019). Multi-order Scaling of High-throughput Transmission Electron Microscopy. Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 25(Suppl 2), 1040. https://doi.org/10.1017/s1431927619005932

Chicago Style (17th ed.) Citation

CS, Own, DeRego T, Own LS, Weppelman G, Wanner AA, Ströh S, Hammerschmith E, Vishwanathan A, and Seung HS. "Multi-order Scaling of High-throughput Transmission Electron Microscopy." Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada 25, no. Suppl 2 (2019): 1040. https://doi.org/10.1017/s1431927619005932.

MLA (9th ed.) Citation

CS, Own, et al. "Multi-order Scaling of High-throughput Transmission Electron Microscopy." Microscopy and Microanalysis : The Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, vol. 25, no. Suppl 2, 2019, p. 1040, https://doi.org/10.1017/s1431927619005932.