| Authors: |
Li XP; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China.; Henan Key Laboratory of Optoelectronic Sensing Integrated Application, Henan Normal University, Xinxiang 453600, China.; Academician Workstation of Electromagnetic Wave Engineering of Henan Province, Henan Normal University, Xinxiang 453600, China., Xu G; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China., Duan CJ; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China., Ma MR; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China., Shi SE; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China.; Henan Key Laboratory of Optoelectronic Sensing Integrated Application, Henan Normal University, Xinxiang 453600, China.; Academician Workstation of Electromagnetic Wave Engineering of Henan Province, Henan Normal University, Xinxiang 453600, China., Li W; College of Electronic and Electrical Engineering, Henan Normal University, Xinxiang 453600, China.; Henan Key Laboratory of Optoelectronic Sensing Integrated Application, Henan Normal University, Xinxiang 453600, China.; Academician Workstation of Electromagnetic Wave Engineering of Henan Province, Henan Normal University, Xinxiang 453600, China. |
