APA (7th ed.) Citation

SL, R., N, P., JS, L., MK, M., CI, P., GA, K., & KM, R. (2021). Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes. The Review of scientific instruments, 92(11), 113701. https://doi.org/10.1063/5.0054646

Chicago Style (17th ed.) Citation

SL, Riechers, Petrik N, Loring JS, Murphy MK, Pearce CI, Kimmel GA, and Rosso KM. "Integrated Atomic Force Microscopy and X-ray Irradiation for in Situ Characterization of Radiation-induced Processes." The Review of Scientific Instruments 92, no. 11 (2021): 113701. https://doi.org/10.1063/5.0054646.

MLA (9th ed.) Citation

SL, Riechers, et al. "Integrated Atomic Force Microscopy and X-ray Irradiation for in Situ Characterization of Radiation-induced Processes." The Review of Scientific Instruments, vol. 92, no. 11, 2021, p. 113701, https://doi.org/10.1063/5.0054646.