Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes.
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| Title: | Integrated atomic force microscopy and x-ray irradiation for in situ characterization of radiation-induced processes. |
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| Authors: | Riechers SL; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Petrik N; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Loring JS; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Murphy MK; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Pearce CI; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Kimmel GA; Pacific Northwest National Laboratory, Richland, Washington 99352, USA., Rosso KM; Pacific Northwest National Laboratory, Richland, Washington 99352, USA. |
| Source: | The Review of scientific instruments [Rev Sci Instrum] 2021 Nov 01; Vol. 92 (11), pp. 113701. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: American Institute Of Physics Country of Publication: United States NLM ID: 0405571 Publication Model: Print Cited Medium: Internet ISSN: 1089-7623 (Electronic) Linking ISSN: 00346748 NLM ISO Abbreviation: Rev Sci Instrum Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| ISSN: | 1089-7623 |
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| DOI: | 10.1063/5.0054646 |
