| Authors: |
Wang JI; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA. joelwang@mit.edu., Yamoah MA; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Li Q; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Karamlou AH; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Dinh T; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA., Kannan B; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Braumüller J; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA., Kim D; MIT Lincoln Laboratory, Lexington, MA, USA., Melville AJ; MIT Lincoln Laboratory, Lexington, MA, USA., Muschinske SE; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Niedzielski BM; MIT Lincoln Laboratory, Lexington, MA, USA., Serniak K; MIT Lincoln Laboratory, Lexington, MA, USA., Sung Y; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Winik R; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA., Yoder JL; MIT Lincoln Laboratory, Lexington, MA, USA., Schwartz ME; MIT Lincoln Laboratory, Lexington, MA, USA., Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, Tsukuba, Japan., Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Japan., Orlando TP; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA., Gustavsson S; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA., Jarillo-Herrero P; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA. pjarillo@mit.edu., Oliver WD; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA. william.oliver@mit.edu.; Department of Physics, Massachusetts Institute of Technology, Cambridge, MA, USA. william.oliver@mit.edu.; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA. william.oliver@mit.edu.; MIT Lincoln Laboratory, Lexington, MA, USA. william.oliver@mit.edu. |
