Image difference metrics for high-resolution electron microscopy.

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Title: Image difference metrics for high-resolution electron microscopy.
Authors: Ederer M; University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria. Electronic address: manuel.ederer@tuwien.ac.at., Löffler S; University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria.
Source: Ultramicroscopy [Ultramicroscopy] 2022 Oct; Vol. 240, pp. 113578. Date of Electronic Publication: 2022 Jun 25.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE
Database: MEDLINE Ultimate
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Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 35785644
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Image difference metrics for high-resolution electron microscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Ederer+M%22">Ederer M</searchLink>; University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria. Electronic address: manuel.ederer@tuwien.ac.at.<br /><searchLink fieldCode="AU" term="%22Löffler+S%22">Löffler S</searchLink>; University Service Centre for Transmission Electron Microscopy, TU Wien, Wiedner Hauptstraße 8-10/E057-02, 1040 Wien, Austria.
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2022 Oct; Vol. 240, pp. 113578. <i>Date of Electronic Publication: </i>2022 Jun 25.
– Name: TypePub
  Label: Publication Type
  Group: TypPub
  Data: Journal Article
– Name: TitleSource
  Label: Journal Info
  Group: Src
  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=35785644
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.ultramic.2022.113578
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 113578
    Titles:
      – TitleFull: Image difference metrics for high-resolution electron microscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Ederer M
      – PersonEntity:
          Name:
            NameFull: Löffler S
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 10
              Text: 2022 Oct
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-electronic
              Value: 1879-2723
          Numbering:
            – Type: volume
              Value: 240
          Titles:
            – TitleFull: Ultramicroscopy
              Type: main
ResultId 1