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A Van Der Waals Reconfigurable Multi-Valued Logic Device and Circuit Based on Tunable Negative-Differential-Resistance Phenomenon.

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Title: A Van Der Waals Reconfigurable Multi-Valued Logic Device and Circuit Based on Tunable Negative-Differential-Resistance Phenomenon.
Authors: Seo S; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Cho JI; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Jung KS; Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, 16417, Korea.; Memory Technology Design Team, Samsung Electronics Co. Ltd, Hwasung, 18448, Korea., Andreev M; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Lee JH; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Ahn H; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Jung S; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02139, USA., Lee T; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Kim B; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Lee S; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Kang J; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Lee KB; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Lee HJ; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea., Kim KS; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16417, Korea.; School of Semiconductor Science & Technology, Jeonbuk National University, Jeonju, 54896, Korea., Yeom GY; School of Semiconductor Science & Technology, Jeonbuk National University, Jeonju, 54896, Korea., Heo K; Sungkyunkwan Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 16417, Korea., Park JH; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.; Sungkyunkwan Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 16417, Korea.
Source: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2022 Sep; Vol. 34 (36), pp. e2202799. Date of Electronic Publication: 2022 Aug 07.
Publication Type: Journal Article
Journal Info: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 9885358 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1521-4095 (Electronic) Linking ISSN: 09359648 NLM ISO Abbreviation: Adv Mater Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: A Van Der Waals Reconfigurable Multi-Valued Logic Device and Circuit Based on Tunable Negative-Differential-Resistance Phenomenon.
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  Data: <searchLink fieldCode="AU" term="%22Seo+S%22">Seo S</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Cho+JI%22">Cho JI</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Jung+KS%22">Jung KS</searchLink>; Department of Semiconductor and Display Engineering, Sungkyunkwan University, Suwon, 16417, Korea.; Memory Technology Design Team, Samsung Electronics Co. Ltd, Hwasung, 18448, Korea.<br /><searchLink fieldCode="AU" term="%22Andreev+M%22">Andreev M</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Lee+JH%22">Lee JH</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Ahn+H%22">Ahn H</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Jung+S%22">Jung S</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.; Research Laboratory of Electronics, Massachusetts Institute of Technology (MIT), Cambridge, MA, 02139, USA.<br /><searchLink fieldCode="AU" term="%22Lee+T%22">Lee T</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Kim+B%22">Kim B</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Lee+S%22">Lee S</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Kang+J%22">Kang J</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Lee+KB%22">Lee KB</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Lee+HJ%22">Lee HJ</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.<br /><searchLink fieldCode="AU" term="%22Kim+KS%22">Kim KS</searchLink>; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, 16417, Korea.; School of Semiconductor Science & Technology, Jeonbuk National University, Jeonju, 54896, Korea.<br /><searchLink fieldCode="AU" term="%22Yeom+GY%22">Yeom GY</searchLink>; School of Semiconductor Science & Technology, Jeonbuk National University, Jeonju, 54896, Korea.<br /><searchLink fieldCode="AU" term="%22Heo+K%22">Heo K</searchLink>; Sungkyunkwan Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 16417, Korea.<br /><searchLink fieldCode="AU" term="%22Park+JH%22">Park JH</searchLink>; Department of Electrical and Computer Engineering, Sungkyunkwan University (SKKU), Suwon, 16419, Korea.; Sungkyunkwan Advanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon, 16417, Korea.
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