APA (7th ed.) Citation

RR, K., AG, C., AA, K., & AM, M. (2022). On the Reliability of HZO-Based Ferroelectric Capacitors: The Cases of Ru and TiN Electrodes. Nanomaterials (Basel, Switzerland), 12(17), . https://doi.org/10.3390/nano12173059

Chicago Style (17th ed.) Citation

RR, Khakimov, Chernikova AG, Koroleva AA, and Markeev AM. "On the Reliability of HZO-Based Ferroelectric Capacitors: The Cases of Ru and TiN Electrodes." Nanomaterials (Basel, Switzerland) 12, no. 17 (2022). https://doi.org/10.3390/nano12173059.

MLA (9th ed.) Citation

RR, Khakimov, et al. "On the Reliability of HZO-Based Ferroelectric Capacitors: The Cases of Ru and TiN Electrodes." Nanomaterials (Basel, Switzerland), vol. 12, no. 17, 2022, https://doi.org/10.3390/nano12173059.