Modeling Signal-to-Noise Ratio of CMOS Image Sensors with a Stochastic Approach under Non-Stationary Conditions.

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Title: Modeling Signal-to-Noise Ratio of CMOS Image Sensors with a Stochastic Approach under Non-Stationary Conditions.
Authors: Cherniak G; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 3200003, Israel., Nemirovsky J; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 3200003, Israel., Nemirovsky A; Department of Electrical Engineering, Kinneret College on the Sea of Galilee, Tzemah 1513200, Israel., Nemirovsky Y; Electrical Engineering Department, Technion-Israel Institute of Technology, Haifa 3200003, Israel.
Source: Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Aug 23; Vol. 23 (17). Date of Electronic Publication: 2023 Aug 23.
Publication Type: Journal Article
Journal Info: Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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ISSN:1424-8220
DOI:10.3390/s23177344