| Authors: |
Ho PH; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 300091, Taiwan., Yang YY; Department of Electrical Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan., Chou SA; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 300091, Taiwan., Cheng RH; Department of Electrical Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan., Pao PH; Department of Electrical Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan., Cheng CC; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 300091, Taiwan., Radu I; Corporate Research, Taiwan Semiconductor Manufacturing Company, Hsinchu 300091, Taiwan., Chien CH; Department of Electrical Engineering, National Yang Ming Chiao Tung University, Hsinchu 300093, Taiwan. |