N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.
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| Title: | N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors. |
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| Authors: | Liu CH; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan., Lin SD; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan. |
| Source: | Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Dec 03; Vol. 23 (23). Date of Electronic Publication: 2023 Dec 03. |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
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| ISSN: | 1424-8220 |
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| DOI: | 10.3390/s23239586 |
