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N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.

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Title: N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.
Authors: Liu CH; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan., Lin SD; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan.
Source: Sensors (Basel, Switzerland) [Sensors (Basel)] 2023 Dec 03; Vol. 23 (23). Date of Electronic Publication: 2023 Dec 03.
Publication Type: Journal Article
Journal Info: Publisher: MDPI Country of Publication: Switzerland NLM ID: 101204366 Publication Model: Electronic Cited Medium: Internet ISSN: 1424-8220 (Electronic) Linking ISSN: 14248220 NLM ISO Abbreviation: Sensors (Basel) Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.
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  Data: <searchLink fieldCode="AU" term="%22Liu+CH%22">Liu CH</searchLink>; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan.<br /><searchLink fieldCode="AU" term="%22Lin+SD%22">Lin SD</searchLink>; Institute of Electronics, National Yang Ming Chiao Tung University, Hsinchu 300, Taiwan.
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  Data: <searchLink fieldCode="JN" term="%22101204366%22">Sensors (Basel, Switzerland)</searchLink> [Sensors (Basel)] 2023 Dec 03; Vol. 23 (23). <i>Date of Electronic Publication: </i>2023 Dec 03.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22MDPI%22">MDPI </searchLink><i>Country of Publication: </i>Switzerland <i>NLM ID: </i>101204366 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1424-8220 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2214248220%22">14248220 </searchLink><i>NLM ISO Abbreviation: </i>Sensors (Basel) <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.3390/s23239586
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      – Code: eng
        Text: English
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      – TitleFull: N-Channel MOSFET Reliability Issue Induced by Visible/Near-Infrared Photons in Image Sensors.
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            NameFull: Liu CH
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            – D: 03
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              Text: 2023 Dec 03
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              Y: 2023
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              Value: 23
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