Delayed Intradevice Leak Due to Torn Left Atrial Appendage Occlusion Device Membrane.

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Bibliographic Details
Title: Delayed Intradevice Leak Due to Torn Left Atrial Appendage Occlusion Device Membrane.
Authors: Miklin DJ; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA. Electronic address: dmiklin@northwell.edu., Gabriels JK; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Wharton R; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Sugeng L; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Willner J; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Beldner S; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Epstein LM; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Mitra R; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA. Electronic address: rmitra1@northwell.edu.
Source: JACC. Clinical electrophysiology [JACC Clin Electrophysiol] 2024 Sep; Vol. 10 (9), pp. 2108-2110. Date of Electronic Publication: 2024 Jul 10.
Publication Type: Case Reports; Journal Article
Journal Info: Publisher: Elsevier Inc Country of Publication: United States NLM ID: 101656995 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2405-5018 (Electronic) Linking ISSN: 2405500X NLM ISO Abbreviation: JACC Clin Electrophysiol Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2405-5018
DOI:10.1016/j.jacep.2024.05.020