Delayed Intradevice Leak Due to Torn Left Atrial Appendage Occlusion Device Membrane.
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| Title: | Delayed Intradevice Leak Due to Torn Left Atrial Appendage Occlusion Device Membrane. |
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| Authors: | Miklin DJ; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA. Electronic address: dmiklin@northwell.edu., Gabriels JK; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Wharton R; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Sugeng L; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Willner J; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Beldner S; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Epstein LM; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA., Mitra R; Northwell, Cardiovascular Institute, North Shore University Hospital, New Hyde Park, New York, USA. Electronic address: rmitra1@northwell.edu. |
| Source: | JACC. Clinical electrophysiology [JACC Clin Electrophysiol] 2024 Sep; Vol. 10 (9), pp. 2108-2110. Date of Electronic Publication: 2024 Jul 10. |
| Publication Type: | Case Reports; Journal Article |
| Journal Info: | Publisher: Elsevier Inc Country of Publication: United States NLM ID: 101656995 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 2405-5018 (Electronic) Linking ISSN: 2405500X NLM ISO Abbreviation: JACC Clin Electrophysiol Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
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