AC metrology applications of the Josephson effect.

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Bibliographic Details
Title: AC metrology applications of the Josephson effect.
Authors: Benz SP; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Biesecker J; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Burroughs CJ; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Castellanos-Beltran MA; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Dresselhaus PD; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Flowers-Jacobs NE; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Fox AE; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Hopkins PF; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Johnson-Wilke R; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Olaya D; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Rüfenacht A; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Sirois AJ; National Institute of Standards and Technology, Boulder, Colorado 80305, USA., Thomas JN; National Institute of Standards and Technology, Boulder, Colorado 80305, USA.
Source: Applied physics letters [Appl Phys Lett] 2024; Vol. 125 (5).
Publication Type: Journal Article
Journal Info: Publisher: American Institute of Physics Country of Publication: United States NLM ID: 9881183 Publication Model: Print Cited Medium: Print ISSN: 0003-6951 (Print) Linking ISSN: 00036951 NLM ISO Abbreviation: Appl Phys Lett Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:0003-6951
DOI:10.1063/5.0219991