Deep learning-based defect detection in film-coated tablets using a convolutional neural network.

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Bibliographic Details
Title: Deep learning-based defect detection in film-coated tablets using a convolutional neural network.
Authors: Pathak KA; Pharmaceutical Sciences and Clinical Supply, Merck & Co., Inc., Rahway, NJ, USA., Kafle P; Pharmaceutical Sciences and Clinical Supply, Merck & Co., Inc., Rahway, NJ, USA. Electronic address: prapti.kafle@merck.com., Vikram A; Process Research & Development, Merck & Co., Inc., Rahway, NJ, USA.
Source: International journal of pharmaceutics [Int J Pharm] 2025 Feb 25; Vol. 671, pp. 125220. Date of Electronic Publication: 2025 Jan 18.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier/North-Holland Biomedical Press Country of Publication: Netherlands NLM ID: 7804127 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1873-3476 (Electronic) Linking ISSN: 03785173 NLM ISO Abbreviation: Int J Pharm Subsets: MEDLINE
Database: MEDLINE Ultimate
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