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Cross-Point Ferroelectric Hf0.5Zr0.5O2 Capacitors for Remanent Polarization-Driven In-Memory Computing.

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Title: Cross-Point Ferroelectric Hf0.5Zr0.5O2 Capacitors for Remanent Polarization-Driven In-Memory Computing.
Authors: Lee M; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Zhou P; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Hernandez-Arriaga H; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Jung YC; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Kim JH; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Hassan N; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Brigner WH; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Deremo L; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Friedman JS; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States., Kim J; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.
Source: Nano letters [Nano Lett] 2025 Feb 05; Vol. 25 (5), pp. 1831-1837. Date of Electronic Publication: 2025 Jan 23.
Publication Type: Journal Article
Journal Info: Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Cross-Point Ferroelectric Hf<subscript>0.5</subscript>Zr<subscript>0.5</subscript>O<subscript>2</subscript> Capacitors for Remanent Polarization-Driven In-Memory Computing.
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  Data: <searchLink fieldCode="AU" term="%22Lee+M%22">Lee M</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Zhou+P%22">Zhou P</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Hernandez-Arriaga+H%22">Hernandez-Arriaga H</searchLink>; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Jung+YC%22">Jung YC</searchLink>; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Kim+JH%22">Kim JH</searchLink>; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Hassan+N%22">Hassan N</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Brigner+WH%22">Brigner WH</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Deremo+L%22">Deremo L</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Friedman+JS%22">Friedman JS</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.<br /><searchLink fieldCode="AU" term="%22Kim+J%22">Kim J</searchLink>; Department of Electrical and Computer Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.; Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, United States.
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  Data: <searchLink fieldCode="JN" term="%22101088070%22">Nano letters</searchLink> [Nano Lett] 2025 Feb 05; Vol. 25 (5), pp. 1831-1837. <i>Date of Electronic Publication: </i>2025 Jan 23.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22American+Chemical+Society%22">American Chemical Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101088070 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1530-6992 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2215306984%22">15306984 </searchLink><i>NLM ISO Abbreviation: </i>Nano Lett <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1021/acs.nanolett.4c04771
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              Text: 2025 Feb 05
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