R, D., L, G., A, Y., L, R., AV, R., & KR, B. (2025). Studying novel high-pressure phases in laser-shock-affected silicon using poly: An algorithm for spot-wise phase identification. Journal of applied crystallography, 58(Pt 1), 128. https://doi.org/10.1107/S1600576724011178
Chicago Style (17th ed.) CitationR, Doostkam, Gelisio L, Yurtsever A, Rapp L, Rode AV, and Beyerlein KR. "Studying Novel High-pressure Phases in Laser-shock-affected Silicon Using Poly: An Algorithm for Spot-wise Phase Identification." Journal of Applied Crystallography 58, no. Pt 1 (2025): 128. https://doi.org/10.1107/S1600576724011178.
MLA (9th ed.) CitationR, Doostkam, et al. "Studying Novel High-pressure Phases in Laser-shock-affected Silicon Using Poly: An Algorithm for Spot-wise Phase Identification." Journal of Applied Crystallography, vol. 58, no. Pt 1, 2025, p. 128, https://doi.org/10.1107/S1600576724011178.