View in EDS

Studying novel high-pressure phases in laser-shock-affected silicon using poly: an algorithm for spot-wise phase identification.

Saved in:
Bibliographic Details
Title: Studying novel high-pressure phases in laser-shock-affected silicon using poly: an algorithm for spot-wise phase identification.
Authors: Doostkam R; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada., Gelisio L; European XFEL X-ray Free-Electron Laser Source Hamburg Germany., Yurtsever A; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada., Rapp L; Laser Physics Centre, Department of Quantum Science and Technology, Research School of Physics Australian National University Canberra Australian Capital Territory Australia., Rode AV; Laser Physics Centre, Department of Quantum Science and Technology, Research School of Physics Australian National University Canberra Australian Capital Territory Australia., Beyerlein KR; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada.
Source: Journal of applied crystallography [J Appl Crystallogr] 2025 Feb 01; Vol. 58 (Pt 1), pp. 128-137. Date of Electronic Publication: 2025 Feb 01 (Print Publication: 2025).
Publication Type: Journal Article
Journal Info: Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9876190 Publication Model: eCollection Cited Medium: Print ISSN: 0021-8898 (Print) Linking ISSN: 00218898 NLM ISO Abbreviation: J Appl Crystallogr Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
FullText Text:
  Availability: 0
Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 39917184
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Studying novel high-pressure phases in laser-shock-affected silicon using poly: an algorithm for spot-wise phase identification.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Doostkam+R%22">Doostkam R</searchLink>; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada.<br /><searchLink fieldCode="AU" term="%22Gelisio+L%22">Gelisio L</searchLink>; European XFEL X-ray Free-Electron Laser Source Hamburg Germany.<br /><searchLink fieldCode="AU" term="%22Yurtsever+A%22">Yurtsever A</searchLink>; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada.<br /><searchLink fieldCode="AU" term="%22Rapp+L%22">Rapp L</searchLink>; Laser Physics Centre, Department of Quantum Science and Technology, Research School of Physics Australian National University Canberra Australian Capital Territory Australia.<br /><searchLink fieldCode="AU" term="%22Rode+AV%22">Rode AV</searchLink>; Laser Physics Centre, Department of Quantum Science and Technology, Research School of Physics Australian National University Canberra Australian Capital Territory Australia.<br /><searchLink fieldCode="AU" term="%22Beyerlein+KR%22">Beyerlein KR</searchLink>; Institut National de la Recherche Scientifique - Énergie Matériaux Télécommunications Varennes Québec Canada.
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%229876190%22">Journal of applied crystallography</searchLink> [J Appl Crystallogr] 2025 Feb 01; Vol. 58 (Pt 1), pp. 128-137. <i>Date of Electronic Publication: </i>2025 Feb 01 (<i>Print Publication: </i>2025).
– Name: TypePub
  Label: Publication Type
  Group: TypPub
  Data: Journal Article
– Name: TitleSource
  Label: Journal Info
  Group: Src
  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley+Online+Library%22">Wiley Online Library </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>9876190 <i>Publication Model: </i>eCollection <i>Cited Medium: </i>Print <i>ISSN: </i>0021-8898 (Print) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2200218898%22">00218898 </searchLink><i>NLM ISO Abbreviation: </i>J Appl Crystallogr <i>Subsets: </i>PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=39917184
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1107/S1600576724011178
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 128
    Titles:
      – TitleFull: Studying novel high-pressure phases in laser-shock-affected silicon using poly: an algorithm for spot-wise phase identification.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Doostkam R
      – PersonEntity:
          Name:
            NameFull: Gelisio L
      – PersonEntity:
          Name:
            NameFull: Yurtsever A
      – PersonEntity:
          Name:
            NameFull: Rapp L
      – PersonEntity:
          Name:
            NameFull: Rode AV
      – PersonEntity:
          Name:
            NameFull: Beyerlein KR
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 02
              Text: 2025 Feb 01
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 0021-8898
          Numbering:
            – Type: volume
              Value: 58
            – Type: issue
              Value: Pt 1
          Titles:
            – TitleFull: Journal of applied crystallography
              Type: main
ResultId 1