Important Concepts in Building a Positive Culture in a Residency Program.
Saved in:
| Title: | Important Concepts in Building a Positive Culture in a Residency Program. |
|---|---|
| Authors: | Fisch R; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Kuchakulla M; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Tzeng M; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Gurayah AA; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Ma R; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Pearce R; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Lee R; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA., Davuluri M; Department of Urology, NewYork-Presbyterian Hospital, New York, NY, USA. med9115@med.cornell.edu.; Department of Urology, Weill Cornell Medical Center, New York, NY, USA. med9115@med.cornell.edu. |
| Source: | Current urology reports [Curr Urol Rep] 2025 Jun 03; Vol. 26 (1), pp. 48. Date of Electronic Publication: 2025 Jun 03. |
| Publication Type: | Journal Article; Review |
| Journal Info: | Publisher: Current Science Country of Publication: United States NLM ID: 100900943 Publication Model: Electronic Cited Medium: Internet ISSN: 1534-6285 (Electronic) Linking ISSN: 15272737 NLM ISO Abbreviation: Curr Urol Rep Subsets: MEDLINE |
| Database: | MEDLINE Ultimate |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
