DL, F., EH, M., Y, W., DE, S., & ML, T. (2025). Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscope. Micron (Oxford, England : 1993), 196-197, 103864. https://doi.org/10.1016/j.micron.2025.103864
Chicago Style (17th ed.) CitationDL, Foley, Mang EH, Wang Y, Spearot DE, and Taheri ML. "Low Frequency Band Pass Fourier Filtering for Irradiation Damage Analysis in the Transmission Electron Microscope." Micron (Oxford, England : 1993) 196-197 (2025): 103864. https://doi.org/10.1016/j.micron.2025.103864.
MLA (9th ed.) CitationDL, Foley, et al. "Low Frequency Band Pass Fourier Filtering for Irradiation Damage Analysis in the Transmission Electron Microscope." Micron (Oxford, England : 1993), vol. 196-197, 2025, p. 103864, https://doi.org/10.1016/j.micron.2025.103864.