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Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscope.

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Title: Low frequency band pass Fourier filtering for irradiation damage analysis in the transmission electron microscope.
Authors: Foley DL; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States., Mang EH; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States., Wang Y; Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States., Spearot DE; University of Florida, Department of Mechanical & Aerospace Engineering, Gainesville, FL 32611, United States., Taheri ML; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States. Electronic address: mtaheri4@jhu.edu.
Source: Micron (Oxford, England : 1993) [Micron] 2025 Sep; Vol. 196-197, pp. 103864. Date of Electronic Publication: 2025 Jun 07.
Publication Type: Journal Article
Journal Info: Publisher: Pergamon Press Country of Publication: England NLM ID: 9312850 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1878-4291 (Electronic) Linking ISSN: 09684328 NLM ISO Abbreviation: Micron Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: <searchLink fieldCode="AU" term="%22Foley+DL%22">Foley DL</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States.<br /><searchLink fieldCode="AU" term="%22Mang+EH%22">Mang EH</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States.<br /><searchLink fieldCode="AU" term="%22Wang+Y%22">Wang Y</searchLink>; Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, United States; Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, United States.<br /><searchLink fieldCode="AU" term="%22Spearot+DE%22">Spearot DE</searchLink>; University of Florida, Department of Mechanical & Aerospace Engineering, Gainesville, FL 32611, United States.<br /><searchLink fieldCode="AU" term="%22Taheri+ML%22">Taheri ML</searchLink>; Johns Hopkins University, Department of Materials Science and Engineering, Baltimore, MD 21218, United States. Electronic address: mtaheri4@jhu.edu.
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  Data: <searchLink fieldCode="JN" term="%229312850%22">Micron (Oxford, England : 1993)</searchLink> [Micron] 2025 Sep; Vol. 196-197, pp. 103864. <i>Date of Electronic Publication: </i>2025 Jun 07.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Pergamon+Press%22">Pergamon Press </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>9312850 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1878-4291 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2209684328%22">09684328 </searchLink><i>NLM ISO Abbreviation: </i>Micron <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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