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Systematic Investigation of Sparse Perturbed Sharpness-Aware Minimization Optimizer.

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Title: Systematic Investigation of Sparse Perturbed Sharpness-Aware Minimization Optimizer.
Authors: Mi P, Shen L, Ren T, Zhou Y, Xu T, Sun X, Liu T, Ji R, Tao D
Source: IEEE transactions on pattern analysis and machine intelligence [IEEE Trans Pattern Anal Mach Intell] 2025 Oct; Vol. 47 (10), pp. 8538-8549.
Publication Type: Journal Article
Journal Info: Publisher: IEEE Computer Society Country of Publication: United States NLM ID: 9885960 Publication Model: Print Cited Medium: Internet ISSN: 1939-3539 (Electronic) Linking ISSN: 00985589 NLM ISO Abbreviation: IEEE Trans Pattern Anal Mach Intell Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Availability: 0
Header DbId: mdl
DbLabel: MEDLINE Ultimate
An: 40577305
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Systematic Investigation of Sparse Perturbed Sharpness-Aware Minimization Optimizer.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22IEEE+Computer+Society%22">IEEE Computer Society </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>9885960 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1939-3539 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2200985589%22">00985589 </searchLink><i>NLM ISO Abbreviation: </i>IEEE Trans Pattern Anal Mach Intell <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=40577305
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1109/TPAMI.2025.3581310
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      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        StartPage: 8538
    Titles:
      – TitleFull: Systematic Investigation of Sparse Perturbed Sharpness-Aware Minimization Optimizer.
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            NameFull: Mi P
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          Name:
            NameFull: Shen L
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            NameFull: Ren T
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            NameFull: Zhou Y
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            NameFull: Xu T
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            NameFull: Sun X
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            NameFull: Liu T
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            NameFull: Ji R
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            – D: 01
              M: 10
              Text: 2025 Oct
              Type: published
              Y: 2025
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              Value: 1939-3539
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              Value: 47
            – Type: issue
              Value: 10
          Titles:
            – TitleFull: IEEE transactions on pattern analysis and machine intelligence
              Type: main
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