| Authors: |
Denisova YY; Higher School of Law and Forensic Technical Expertis, Peter the Great St. Petersburg Polytechnic University, Russia, 195251, St. Petersburg, st. Politekhnicheskaya, 29, Russia., Kochemirovskaya SV; Department of Engineering Physics and Electronics, Azerbaijan Technical University. Republic of Azerbaijan, AZ 1073, Baku, 25 G. Javid Ave, Azerbaijan., Mehrabova MA; Department of Engineering Physics and Electronics, Azerbaijan Technical University. Republic of Azerbaijan, AZ 1073, Baku, 25 G. Javid Ave, Azerbaijan., Gulmemmedov KJ; Department of Engineering Physics and Electronics, Azerbaijan Technical University. Republic of Azerbaijan, AZ 1073, Baku, 25 G. Javid Ave, Azerbaijan., Mokhorov DA; Higher School of Law and Forensic Technical Expertis, Peter the Great St. Petersburg Polytechnic University, Russia, 195251, St. Petersburg, st. Politekhnicheskaya, 29, Russia., Novomlinskii MO; Higher School of Law and Forensic Technical Expertis, Peter the Great St. Petersburg Polytechnic University, Russia, 195251, St. Petersburg, st. Politekhnicheskaya, 29, Russia., Alyukov ID; Higher School of Law and Forensic Technical Expertis, Peter the Great St. Petersburg Polytechnic University, Russia, 195251, St. Petersburg, st. Politekhnicheskaya, 29, Russia., Kochemirovsky VA; Higher School of Law and Forensic Technical Expertis, Peter the Great St. Petersburg Polytechnic University, Russia, 195251, St. Petersburg, st. Politekhnicheskaya, 29, Russia.; Laboratory of nanobiotechnologies, Alferov University, 194021, Saint Petersburg, Khlopina street, house 8, building 3, letter A. |
