APA (7th ed.) Citation

Z, Q., Y, M., J, L., Y, H., N, L., X, H., . . . J, Z. (2025). Deep learning for sub-ångström-resolution imaging in uncorrected scanning transmission electron microscopy. National science review, 12(8), nwaf235. https://doi.org/10.1093/nsr/nwaf235

Chicago Style (17th ed.) Citation

Z, Qiu, et al. "Deep Learning for Sub-ångström-resolution Imaging in Uncorrected Scanning Transmission Electron Microscopy." National Science Review 12, no. 8 (2025): nwaf235. https://doi.org/10.1093/nsr/nwaf235.

MLA (9th ed.) Citation

Z, Qiu, et al. "Deep Learning for Sub-ångström-resolution Imaging in Uncorrected Scanning Transmission Electron Microscopy." National Science Review, vol. 12, no. 8, 2025, p. nwaf235, https://doi.org/10.1093/nsr/nwaf235.