EQ-ViT: Algorithm-Hardware Co-Design for End-to-End Acceleration of Real-Time Vision Transformer Inference on Versal ACAP Architecture.

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Bibliographic Details
Title: EQ-ViT: Algorithm-Hardware Co-Design for End-to-End Acceleration of Real-Time Vision Transformer Inference on Versal ACAP Architecture.
Authors: Dong P; Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA., Zhuang J; School of Engineering, Brown University, 345 Brook Street, Providence, RI 02912, USA., Yang Z; School of Engineering, Brown University, 345 Brook Street, Providence, RI 02912, USA., Ji S; School of Engineering, Brown University, 345 Brook Street, Providence, RI 02912, USA., Li Y; Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA., Xu D; Department of Computer Science, North Carolina State University, Raleigh, NC 27695, USA., Huang H; Department of Computer Science, University of Maryland, College Park, MD 20742, USA., Hu J; Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA 15261 USA., Jones AK; Department of Electrical Engineering and Computer Science, Syracuse University, Syracuse, NY 13244, USA., Shi Y; Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN 46556 USA., Wang Y; Department of Electrical and Computer Engineering, Northeastern University, Boston, MA 02115, USA., Zhou P; School of Engineering, Brown University, 345 Brook Street, Providence, RI 02912, USA.
Source: IEEE transactions on computer-aided design of integrated circuits and systems : a publication of the IEEE Circuits and Systems Society [IEEE Trans Comput Aided Des Integr Circuits Syst] 2024 Nov; Vol. 43 (11), pp. 3949-3960. Date of Electronic Publication: 2024 Nov 06.
Publication Type: Journal Article
Journal Info: Publisher: Institute of Electrical and Electronics Engineers Country of Publication: United States NLM ID: 101210570 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1937-4151 (Electronic) Linking ISSN: 02780070 NLM ISO Abbreviation: IEEE Trans Comput Aided Des Integr Circuits Syst Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1937-4151
DOI:10.1109/tcad.2024.3443692