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Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagram.

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Title: Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagram.
Authors: Seong SM; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea., Oh H; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea., Park JS; Department of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea., Bae SH; Department of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea., Nam KC; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Medical Engineering, Dongguk University College of Medicine, Goyang, Korea., Park SY; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Diagnostics, College of Korean Medicine, Dongguk University, Goyang, Korea., Kwon BS; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Physical Medicine and Rehabilitation, Dongguk University Ilsan Hospital, Goyang, Korea., Kim BH; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.
Source: Japan journal of nursing science : JJNS [Jpn J Nurs Sci] 2025 Oct; Vol. 22 (4), pp. e70024.
Publication Type: Journal Article; Observational Study
Journal Info: Publisher: Wiley on behalf of the Japan Academy of Nursing Science Country of Publication: Japan NLM ID: 101227890 Publication Model: Print Cited Medium: Internet ISSN: 1742-7924 (Electronic) Linking ISSN: 17427924 NLM ISO Abbreviation: Jpn J Nurs Sci Subsets: MEDLINE
Database: MEDLINE Ultimate
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagram.
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  Data: <searchLink fieldCode="AU" term="%22Seong+SM%22">Seong SM</searchLink>; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Oh+H%22">Oh H</searchLink>; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Park+JS%22">Park JS</searchLink>; Department of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Bae+SH%22">Bae SH</searchLink>; Department of Nursing, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Nam+KC%22">Nam KC</searchLink>; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Medical Engineering, Dongguk University College of Medicine, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Park+SY%22">Park SY</searchLink>; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Diagnostics, College of Korean Medicine, Dongguk University, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Kwon+BS%22">Kwon BS</searchLink>; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.; Department of Physical Medicine and Rehabilitation, Dongguk University Ilsan Hospital, Goyang, Korea.<br /><searchLink fieldCode="AU" term="%22Kim+BH%22">Kim BH</searchLink>; Department of Otorhinolaryngology-Head and Neck Surgery, Dongguk University Ilsan Hospital, Goyang, Korea.; Center for Medical Device Safety Information Monitoring, Dongguk University Ilsan Hospital, Goyang, Korea.
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  Data: <searchLink fieldCode="JN" term="%22101227890%22">Japan journal of nursing science : JJNS</searchLink> [Jpn J Nurs Sci] 2025 Oct; Vol. 22 (4), pp. e70024.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley+on+behalf+of+the+Japan+Academy+of+Nursing+Science%22">Wiley on behalf of the Japan Academy of Nursing Science </searchLink><i>Country of Publication: </i>Japan <i>NLM ID: </i>101227890 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>1742-7924 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2217427924%22">17427924 </searchLink><i>NLM ISO Abbreviation: </i>Jpn J Nurs Sci <i>Subsets: </i>MEDLINE
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      – Type: doi
        Value: 10.1111/jjns.70024
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      – Code: eng
        Text: English
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        StartPage: e70024
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      – TitleFull: Incidence and root cause analysis of near-miss events in medical device use errors in intensive care units using Ishikawa diagram.
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            – D: 01
              M: 10
              Text: 2025 Oct
              Type: published
              Y: 2025
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              Value: 22
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