APA (7th ed.) Citation

H, S., K, S., HC, H., & H, P. (2025). Temperature-induced interfacial intermixing and trap modulation in ONO-based flash memory capacitors. Nanotechnology, 36(40), . https://doi.org/10.1088/1361-6528/ae08bf

Chicago Style (17th ed.) Citation

H, Son, Sim K, Hwang HC, and Park H. "Temperature-induced Interfacial Intermixing and Trap Modulation in ONO-based Flash Memory Capacitors." Nanotechnology 36, no. 40 (2025). https://doi.org/10.1088/1361-6528/ae08bf.

MLA (9th ed.) Citation

H, Son, et al. "Temperature-induced Interfacial Intermixing and Trap Modulation in ONO-based Flash Memory Capacitors." Nanotechnology, vol. 36, no. 40, 2025, https://doi.org/10.1088/1361-6528/ae08bf.