Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps.

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Title: Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps.
Authors: Folwarczny M; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK. Electronic address: martin.folwarczny@materials.ox.ac.uk., Li A; Department of Materials, Imperial College London, London SW7 2AZ, UK., Shah R; Department of Materials, Imperial College London, London SW7 2AZ, UK., Chote A; Department of Materials, Imperial College London, London SW7 2AZ, UK., Austin AC; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Zhu Y; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Rohrer GS; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA., Jackson MA; BlueQuartz Software, 400 S Pioneer Blvd, Springboro, OH 45066, USA., Kotakadi S; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Marquardt K; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK; The Zero Institute, Holywell House, Osney Mead, Oxford OX2 0ES, UK.
Source: Ultramicroscopy [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114262. Date of Electronic Publication: 2025 Oct 19.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:1879-2723
DOI:10.1016/j.ultramic.2025.114262