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Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps.

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Title: Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps.
Authors: Folwarczny M; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK. Electronic address: martin.folwarczny@materials.ox.ac.uk., Li A; Department of Materials, Imperial College London, London SW7 2AZ, UK., Shah R; Department of Materials, Imperial College London, London SW7 2AZ, UK., Chote A; Department of Materials, Imperial College London, London SW7 2AZ, UK., Austin AC; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Zhu Y; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Rohrer GS; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA., Jackson MA; BlueQuartz Software, 400 S Pioneer Blvd, Springboro, OH 45066, USA., Kotakadi S; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK., Marquardt K; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK; The Zero Institute, Holywell House, Osney Mead, Oxford OX2 0ES, UK.
Source: Ultramicroscopy [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114262. Date of Electronic Publication: 2025 Oct 19.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier Country of Publication: Netherlands NLM ID: 7513702 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1879-2723 (Electronic) Linking ISSN: 03043991 NLM ISO Abbreviation: Ultramicroscopy Subsets: MEDLINE; PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Accurate grain boundary plane distributions for textured microstructures from stereological analysis of orthogonal two-dimensional electron backscatter diffraction orientation maps.
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  Data: <searchLink fieldCode="AU" term="%22Folwarczny+M%22">Folwarczny M</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK. Electronic address: martin.folwarczny@materials.ox.ac.uk.<br /><searchLink fieldCode="AU" term="%22Li+A%22">Li A</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK.<br /><searchLink fieldCode="AU" term="%22Shah+R%22">Shah R</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK.<br /><searchLink fieldCode="AU" term="%22Chote+A%22">Chote A</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK.<br /><searchLink fieldCode="AU" term="%22Austin+AC%22">Austin AC</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK.<br /><searchLink fieldCode="AU" term="%22Zhu+Y%22">Zhu Y</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK.<br /><searchLink fieldCode="AU" term="%22Rohrer+GS%22">Rohrer GS</searchLink>; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA.<br /><searchLink fieldCode="AU" term="%22Jackson+MA%22">Jackson MA</searchLink>; BlueQuartz Software, 400 S Pioneer Blvd, Springboro, OH 45066, USA.<br /><searchLink fieldCode="AU" term="%22Kotakadi+S%22">Kotakadi S</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK.<br /><searchLink fieldCode="AU" term="%22Marquardt+K%22">Marquardt K</searchLink>; Department of Materials, Imperial College London, London SW7 2AZ, UK; Department of Materials, University of Oxford, Oxford OX1 3PH, UK; The Zero Institute, Holywell House, Osney Mead, Oxford OX2 0ES, UK.
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  Data: <searchLink fieldCode="JN" term="%227513702%22">Ultramicroscopy</searchLink> [Ultramicroscopy] 2026 Feb; Vol. 280, pp. 114262. <i>Date of Electronic Publication: </i>2025 Oct 19.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Elsevier%22">Elsevier </searchLink><i>Country of Publication: </i>Netherlands <i>NLM ID: </i>7513702 <i>Publication Model: </i>Print-Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>1879-2723 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2203043991%22">03043991 </searchLink><i>NLM ISO Abbreviation: </i>Ultramicroscopy <i>Subsets: </i>MEDLINE; PubMed not MEDLINE
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        Value: 10.1016/j.ultramic.2025.114262
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        Text: English
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              Text: 2026 Feb
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