Torsional Sensitivity and Resonance Tuning in Width-Varying AFM Microcantilevers.
Saved in:
| Title: | Torsional Sensitivity and Resonance Tuning in Width-Varying AFM Microcantilevers. |
|---|---|
| Authors: | Dat LT; Engineering Research Group, Dong Nai Technology University, Dong Nai Province, Vietnam.; Faculty of Engineering, Dong Nai Technology University, Dong Nai Province, Vietnam., Vy ND; Laboratory of Applied Physics, Science and Technology Advanced Institute, Van Lang University, Ho Chi Minh City, Vietnam.; Faculty of Applied Technology, Van Lang School of Technology, Van Lang University, Ho Chi Minh City, Vietnam. |
| Source: | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2025 Nov 12; Vol. 31 (6). |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Oxford University Press Country of Publication: England NLM ID: 9712707 Publication Model: Print Cited Medium: Internet ISSN: 1435-8115 (Electronic) Linking ISSN: 14319276 NLM ISO Abbreviation: Microsc Microanal Subsets: MEDLINE; PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
Be the first to leave a comment!
