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Demonstration of CMOS-compatible memristor-based electrochemical biosensor transducer with threshold-sensing functionality.

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Title: Demonstration of CMOS-compatible memristor-based electrochemical biosensor transducer with threshold-sensing functionality.
Authors: Kim YJ; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr., Kwon Y; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Yoo Y; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea., Theyagarajan K; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea., Saikrithika S; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea., Lee A; Department of Materials Science and Enginnering,, Chungnam National University (CNU), Daejeon, Republic of Korea., Bae NH; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Lee WC; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Sim G; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Lee Y; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea., Park SO; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea., Cho H; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Kang MH; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Kim Y; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Park Y; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Lee KG; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Kim CY; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Ko H; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Sul WS; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Lee SJ; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea., Ahn JH; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea., Choi S; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. shinhyun@kaist.ac.kr., Kim KM; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. km.kim@kaist.ac.kr., Lee J; Department of Semiconductor Convergence, Chungnam National University (CNU), Daejeon, Republic of Korea. jwlee80@cnu.ac.kr.
Source: Nature communications [Nat Commun] 2025 Dec 03; Vol. 16 (1), pp. 10851. Date of Electronic Publication: 2025 Dec 03.
Publication Type: Journal Article
Journal Info: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101528555 Publication Model: Electronic Cited Medium: Internet ISSN: 2041-1723 (Electronic) Linking ISSN: 20411723 NLM ISO Abbreviation: Nat Commun Subsets: MEDLINE
Database: MEDLINE Ultimate
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  Data: Demonstration of CMOS-compatible memristor-based electrochemical biosensor transducer with threshold-sensing functionality.
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  Data: <searchLink fieldCode="AU" term="%22Kim+YJ%22">Kim YJ</searchLink>; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea. youngkim@gachon.ac.kr.<br /><searchLink fieldCode="AU" term="%22Kwon+Y%22">Kwon Y</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Yoo+Y%22">Yoo Y</searchLink>; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Theyagarajan+K%22">Theyagarajan K</searchLink>; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Saikrithika+S%22">Saikrithika S</searchLink>; Department of Electronic Engineering, Gachon University, Seongnam, Republic of Korea.; Department of Semiconductor Engineering, Gachon University, Seongnam, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+A%22">Lee A</searchLink>; Department of Materials Science and Enginnering,, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Bae+NH%22">Bae NH</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+WC%22">Lee WC</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Sim+G%22">Sim G</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+Y%22">Lee Y</searchLink>; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Park+SO%22">Park SO</searchLink>; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Cho+H%22">Cho H</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Kang+MH%22">Kang MH</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Kim+Y%22">Kim Y</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Park+Y%22">Park Y</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+KG%22">Lee KG</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Kim+CY%22">Kim CY</searchLink>; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Ko+H%22">Ko H</searchLink>; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Sul+WS%22">Sul WS</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Lee+SJ%22">Lee SJ</searchLink>; Division of Nano Convergence Technology Development, National Nanofab Center (NNFC), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Ahn+JH%22">Ahn JH</searchLink>; Department of Electronics Engineering, Chungnam National University (CNU), Daejeon, Republic of Korea.<br /><searchLink fieldCode="AU" term="%22Choi+S%22">Choi S</searchLink>; School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. shinhyun@kaist.ac.kr.<br /><searchLink fieldCode="AU" term="%22Kim+KM%22">Kim KM</searchLink>; Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea. km.kim@kaist.ac.kr.<br /><searchLink fieldCode="AU" term="%22Lee+J%22">Lee J</searchLink>; Department of Semiconductor Convergence, Chungnam National University (CNU), Daejeon, Republic of Korea. jwlee80@cnu.ac.kr.
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  Data: <searchLink fieldCode="JN" term="%22101528555%22">Nature communications</searchLink> [Nat Commun] 2025 Dec 03; Vol. 16 (1), pp. 10851. <i>Date of Electronic Publication: </i>2025 Dec 03.
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