Assessing the co-occurrence of psychopathology and resilience: Evidence for the dual-factor model of mental health using a data-driven approach from a multi-ethnic youth epidemiology study in south-east Asia.

Saved in:
Bibliographic Details
Title: Assessing the co-occurrence of psychopathology and resilience: Evidence for the dual-factor model of mental health using a data-driven approach from a multi-ethnic youth epidemiology study in south-east Asia.
Authors: Singham T; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore; Viriya Community Services, Singapore. Electronic address: tims@nus.edu.sg., Wong JCM; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore; Department of Psychological Medicine, National University Health System, Singapore., Kom DMY; Student Development Curriculum Division, Ministry of Education, Singapore., Fee VHF; Student Development Curriculum Division, Ministry of Education, Singapore., Lei NCL; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Wan JSM; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Hui NJY; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Teoh JY; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Sachiman MNSB; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Sii NE; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Shen L; National University Singapore Medicine Biostatistics Unit, National University of Singapore, Singapore., Yap QV; National University Singapore Medicine Biostatistics Unit, National University of Singapore, Singapore., Du R; National University Singapore Medicine Biostatistics Unit, National University of Singapore, Singapore., Kroneman L; Yeo Boon Khim Mind Science Centre, National University of Singapore, Singapore., Fung DSS; Department of Developmental Psychiatry, Institute of Mental Health, Singapore., Ong SH; Department of Developmental Psychiatry, Institute of Mental Health, Singapore., Tian CS; Department of Psychological Medicine, National University Health System, Singapore., Teng JY; Department of Psychological Medicine, National University Health System, Singapore., Ng TP; Department of Psychological Medicine, National University Health System, Singapore., Verhulst F; Erasmus University Medical Center, Rotterdam, the Netherlands.
Source: Journal of affective disorders [J Affect Disord] 2026 Apr 15; Vol. 399, pp. 121131. Date of Electronic Publication: 2026 Jan 04.
Publication Type: Journal Article
Journal Info: Publisher: Elsevier/North-Holland Biomedical Press Country of Publication: Netherlands NLM ID: 7906073 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1573-2517 (Electronic) Linking ISSN: 01650327 NLM ISO Abbreviation: J Affect Disord Subsets: MEDLINE
Database: MEDLINE Ultimate
Be the first to leave a comment!
You must be logged in first