Plasmonic nanocavity-enabled universal detection of layer-breathing vibrations in two-dimensional materials.

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Title: Plasmonic nanocavity-enabled universal detection of layer-breathing vibrations in two-dimensional materials.
Authors: Wu H; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Lin ML; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Yan S; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China., Chen LS; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China., Wang ZJ; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Zhang YF; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Zhu TY; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Su ZY; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China., Wang J; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China., Liu XL; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China., Wei ZM; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Shi YM; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China., Wang X; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China., Ren B; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China., Tan PH; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China. phtan@semi.ac.cn.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China. phtan@semi.ac.cn.
Source: Light, science & applications [Light Sci Appl] 2026 Feb 06; Vol. 15 (1), pp. 109. Date of Electronic Publication: 2026 Feb 06.
Publication Type: Journal Article
Journal Info: Publisher: Springer Nature Country of Publication: England NLM ID: 101610753 Publication Model: Electronic Cited Medium: Internet ISSN: 2047-7538 (Electronic) Linking ISSN: 20477538 NLM ISO Abbreviation: Light Sci Appl Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
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  Data: Plasmonic nanocavity-enabled universal detection of layer-breathing vibrations in two-dimensional materials.
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  Data: <searchLink fieldCode="AU" term="%22Wu+H%22">Wu H</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Lin+ML%22">Lin ML</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Yan+S%22">Yan S</searchLink>; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China.<br /><searchLink fieldCode="AU" term="%22Chen+LS%22">Chen LS</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.<br /><searchLink fieldCode="AU" term="%22Wang+ZJ%22">Wang ZJ</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Zhang+YF%22">Zhang YF</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Zhu+TY%22">Zhu TY</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Su+ZY%22">Su ZY</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.<br /><searchLink fieldCode="AU" term="%22Wang+J%22">Wang J</searchLink>; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China.<br /><searchLink fieldCode="AU" term="%22Liu+XL%22">Liu XL</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.<br /><searchLink fieldCode="AU" term="%22Wei+ZM%22">Wei ZM</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Shi+YM%22">Shi YM</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China.<br /><searchLink fieldCode="AU" term="%22Wang+X%22">Wang X</searchLink>; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China.<br /><searchLink fieldCode="AU" term="%22Ren+B%22">Ren B</searchLink>; State Key Laboratory of Physical Chemistry of Solid Surfaces, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, China.<br /><searchLink fieldCode="AU" term="%22Tan+PH%22">Tan PH</searchLink>; State Key Laboratory of Semiconductor Physics and Chip Technologies, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China. phtan@semi.ac.cn.; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, China. phtan@semi.ac.cn.
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  Data: <searchLink fieldCode="JN" term="%22101610753%22">Light, science & applications</searchLink> [Light Sci Appl] 2026 Feb 06; Vol. 15 (1), pp. 109. <i>Date of Electronic Publication: </i>2026 Feb 06.
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  Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Springer+Nature%22">Springer Nature </searchLink><i>Country of Publication: </i>England <i>NLM ID: </i>101610753 <i>Publication Model: </i>Electronic <i>Cited Medium: </i>Internet <i>ISSN: </i>2047-7538 (Electronic) <i>Linking ISSN: </i><searchLink fieldCode="IS" term="%2220477538%22">20477538 </searchLink><i>NLM ISO Abbreviation: </i>Light Sci Appl <i>Subsets: </i>PubMed not MEDLINE
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        Value: 10.1038/s41377-026-02203-x
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        Text: English
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              Text: 2026 Feb 06
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