APA (7th ed.) Citation

G, Z., G, F., M, B., M, C., F, C., D, M., . . . MC, G. (2026). Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal-Scanning Probe Lithography. Small science, 6(2), e202500404. https://doi.org/10.1002/smsc.202500404

Chicago Style (17th ed.) Citation

G, Zambito, Ferrando G, Barelli M, Ceccardi M, Caglieris F, Marrè D, Bisio F, Buatier de Mongeot F, and Giordano MC. "Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal-Scanning Probe Lithography." Small Science 6, no. 2 (2026): e202500404. https://doi.org/10.1002/smsc.202500404.

MLA (9th ed.) Citation

G, Zambito, et al. "Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal-Scanning Probe Lithography." Small Science, vol. 6, no. 2, 2026, p. e202500404, https://doi.org/10.1002/smsc.202500404.