Modeling of wheat yield using plant structural biomarkers.

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Bibliographic Details
Title: Modeling of wheat yield using plant structural biomarkers.
Authors: Dwivedi AK; Department of Civil Engineering, Indian Institute of Technology, Roorkee, 247667, Uttarakhand, India., Ojha CSP; Department of Civil Engineering, Indian Institute of Technology, Roorkee, 247667, Uttarakhand, India. cspojha@gmail.com., Singh VP; Department of Biological and Agricultural Engineering & Zachry, Department of Civil Engineering, Texas A & M University, College Station, TX, 77843-2117, USA., Singh N; University of Lucknow, Lucknow, 226007, India., Singh H; School of Computer Science, UPES, Dehradun, 248007, Uttarakhand, India., Singh D; ICAR-Indian Institute of Soil and Water Conservation, RC, Datia, 475661, India. dpk905@gmail.com.
Source: Scientific reports [Sci Rep] 2026 Feb 26; Vol. 16 (1). Date of Electronic Publication: 2026 Feb 26.
Publication Type: Journal Article
Journal Info: Publisher: Nature Publishing Group Country of Publication: England NLM ID: 101563288 Publication Model: Electronic Cited Medium: Internet ISSN: 2045-2322 (Electronic) Linking ISSN: 20452322 NLM ISO Abbreviation: Sci Rep Subsets: MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2045-2322
DOI:10.1038/s41598-026-36373-w