| Authors: |
Sheng Q; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China., Geng JN; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China., Jiang JQ; Institute of Quantum Science and Technology, and Department of Physics, Yanbian University, Yanji, 133002, Jilin, China.; Wang Da-Heng Center, Heilongjiang Key Laboratory of Quantum Control, Harbin University of Science and Technology, Harbin, 150080, China., Liu TC; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China., Spence DJ; MQ Photonics Research Centre, School of Mathematical and Physical Sciences, Macquarie University, Sydney, NSW, 2109, Australia., Pask HM; MQ Photonics Research Centre, School of Mathematical and Physical Sciences, Macquarie University, Sydney, NSW, 2109, Australia., Rao AS; Molecular Chirality Research Center, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, 263-8522, Japan., Omatsu T; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China.; Molecular Chirality Research Center, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba, 263-8522, Japan., Fu SJ; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China., Bai ZX; Center for Advanced Laser Technology, Hebei University of Technology, Tianjin, 300401, China., Lv ZW; Center for Advanced Laser Technology, Hebei University of Technology, Tianjin, 300401, China., Shi W; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China. shiwei@tju.edu.cn., Yao JQ; State Key Laboratory of Precision Measuring Technology and Instruments, School of Precision Instrument of Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China.; Wang Da-Heng Center, Heilongjiang Key Laboratory of Quantum Control, Harbin University of Science and Technology, Harbin, 150080, China., Rosales-Guzmán C; Institute of Quantum Science and Technology, and Department of Physics, Yanbian University, Yanji, 133002, Jilin, China.; Wang Da-Heng Center, Heilongjiang Key Laboratory of Quantum Control, Harbin University of Science and Technology, Harbin, 150080, China.; Centro de Investigaciones en Óptica, A.C., Loma del Bosque 115, Colonia Lomas del Campestre, 37150, León, GTO, Mexico., Zhu ZH; Institute of Quantum Science and Technology, and Department of Physics, Yanbian University, Yanji, 133002, Jilin, China. zhuzhihan@ybu.edu.cn.; Wang Da-Heng Center, Heilongjiang Key Laboratory of Quantum Control, Harbin University of Science and Technology, Harbin, 150080, China. zhuzhihan@ybu.edu.cn. |
