CS, L., J, W., K, B., & HJ, W. (2026). Universal in-line waveform characterization using arbitrary nonlinear responses. Optics express, 34(7), 12026. https://doi.org/10.1364/OE.583769
Chicago Style (17th ed.) CitationCS, Leung, Wiese J, Brupbacher K, and Wörner HJ. "Universal In-line Waveform Characterization Using Arbitrary Nonlinear Responses." Optics Express 34, no. 7 (2026): 12026. https://doi.org/10.1364/OE.583769.
MLA (9th ed.) CitationCS, Leung, et al. "Universal In-line Waveform Characterization Using Arbitrary Nonlinear Responses." Optics Express, vol. 34, no. 7, 2026, p. 12026, https://doi.org/10.1364/OE.583769.
Warning: These citations may not always be 100% accurate.