APA (7th ed.) Citation

J, v. d. L., R, L., V, M., M, K., M, M., K, S., . . . JC, L. (2026). Frequency of electrode migration and other device-related complications in a large single-center cochlear implant cohort. European archives of oto-rhino-laryngology : official journal of the European Federation of Oto-Rhino-Laryngological Societies (EUFOS) : affiliated with the German Society for Oto-Rhino-Laryngology - Head and Neck Surgery, 283(8), 5059. https://doi.org/10.1007/s00405-026-10283-z

Chicago Style (17th ed.) Citation

J, van de Loo, et al. "Frequency of Electrode Migration and Other Device-related Complications in a Large Single-center Cochlear Implant Cohort." European Archives of Oto-rhino-laryngology : Official Journal of the European Federation of Oto-Rhino-Laryngological Societies (EUFOS) : Affiliated with the German Society for Oto-Rhino-Laryngology - Head and Neck Surgery 283, no. 8 (2026): 5059. https://doi.org/10.1007/s00405-026-10283-z.

MLA (9th ed.) Citation

J, van de Loo, et al. "Frequency of Electrode Migration and Other Device-related Complications in a Large Single-center Cochlear Implant Cohort." European Archives of Oto-rhino-laryngology : Official Journal of the European Federation of Oto-Rhino-Laryngological Societies (EUFOS) : Affiliated with the German Society for Oto-Rhino-Laryngology - Head and Neck Surgery, vol. 283, no. 8, 2026, p. 5059, https://doi.org/10.1007/s00405-026-10283-z.