Frequency of electrode migration and other device-related complications in a large single-center cochlear implant cohort. - van de Loo J; Lang-Roth R; Müller V; Kurzawa M; Mayer M; Sharaf K; Jansen L; Kourou S; Klussmann JP; Lüers JC (European archives of oto-rhino-laryngology : official journal of the European Federation of Oto-Rhino-Laryngological Societies (EUFOS) : affiliated with the German Society for Oto-Rhino-Laryngology - Head and Neck Surgery, 2026)