DM, F., G, B., CM, S., J, G., Z, L., DX, H., . . . A, A. (2025). Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems. Advanced materials technologies, 10(17), . https://doi.org/10.1002/admt.202401959
Chicago Style (17th ed.) CitationDM, Fitzgerald, Babakhanova G, Stafford CM, Guag J, Liu Z, Hammer DX, Sochol RD, and Agrawal A. "Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems." Advanced Materials Technologies 10, no. 17 (2025). https://doi.org/10.1002/admt.202401959.
MLA (9th ed.) CitationDM, Fitzgerald, et al. "Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems." Advanced Materials Technologies, vol. 10, no. 17, 2025, https://doi.org/10.1002/admt.202401959.