Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems.
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| Title: | Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems. |
|---|---|
| Authors: | Fitzgerald DM; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA., Babakhanova G; Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Stafford CM; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Guag J; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Liu Z; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Hammer DX; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Sochol RD; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA., Agrawal A; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA. |
| Source: | Advanced materials technologies [Adv Mater Technol] 2025 Sep 04; Vol. 10 (17). |
| Publication Type: | Journal Article |
| Journal Info: | Publisher: Wiley Blackwell Country of Publication: United States NLM ID: 101717732 Publication Model: Print Cited Medium: Internet ISSN: 2365-709X (Electronic) NLM ISO Abbreviation: Adv Mater Technol Subsets: PubMed not MEDLINE |
| Database: | MEDLINE Ultimate |
| FullText | Text: Availability: 0 |
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| Header | DbId: mdl DbLabel: MEDLINE Ultimate An: 42220566 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Fitzgerald+DM%22">Fitzgerald DM</searchLink>; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA.<br /><searchLink fieldCode="AU" term="%22Babakhanova+G%22">Babakhanova G</searchLink>; Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.<br /><searchLink fieldCode="AU" term="%22Stafford+CM%22">Stafford CM</searchLink>; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.<br /><searchLink fieldCode="AU" term="%22Guag+J%22">Guag J</searchLink>; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA.<br /><searchLink fieldCode="AU" term="%22Liu+Z%22">Liu Z</searchLink>; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA.<br /><searchLink fieldCode="AU" term="%22Hammer+DX%22">Hammer DX</searchLink>; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA.<br /><searchLink fieldCode="AU" term="%22Sochol+RD%22">Sochol RD</searchLink>; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA.<br /><searchLink fieldCode="AU" term="%22Agrawal+A%22">Agrawal A</searchLink>; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA. – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22101717732%22">Advanced materials technologies</searchLink> [Adv Mater Technol] 2025 Sep 04; Vol. 10 (17). – Name: TypePub Label: Publication Type Group: TypPub Data: Journal Article – Name: TitleSource Label: Journal Info Group: Src Data: <i>Publisher: </i><searchLink fieldCode="PB" term="%22Wiley+Blackwell%22">Wiley Blackwell </searchLink><i>Country of Publication: </i>United States <i>NLM ID: </i>101717732 <i>Publication Model: </i>Print <i>Cited Medium: </i>Internet <i>ISSN: </i>2365-709X (Electronic) <i>NLM ISO Abbreviation: </i>Adv Mater Technol <i>Subsets: </i>PubMed not MEDLINE |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=mdl&AN=42220566 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/admt.202401959 Languages: – Code: eng Text: English Titles: – TitleFull: Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Fitzgerald DM – PersonEntity: Name: NameFull: Babakhanova G – PersonEntity: Name: NameFull: Stafford CM – PersonEntity: Name: NameFull: Guag J – PersonEntity: Name: NameFull: Liu Z – PersonEntity: Name: NameFull: Hammer DX – PersonEntity: Name: NameFull: Sochol RD – PersonEntity: Name: NameFull: Agrawal A IsPartOfRelationships: – BibEntity: Dates: – D: 04 M: 09 Text: 2025 Sep 04 Type: published Y: 2025 Identifiers: – Type: issn-electronic Value: 2365-709X Numbering: – Type: volume Value: 10 – Type: issue Value: 17 Titles: – TitleFull: Advanced materials technologies Type: main |
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