Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems.

Saved in:
Bibliographic Details
Title: Tailored-Reflectivity Microstructures for Measuring Signal Sensitivity of Optical Coherence Tomography Medical Imaging Systems.
Authors: Fitzgerald DM; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA; Department of Mechanical Engineering, University of California, Berkeley, CA 94720, USA., Babakhanova G; Biosystems and Biomaterials Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Stafford CM; Materials Science and Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA., Guag J; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Liu Z; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Hammer DX; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA., Sochol RD; Department of Mechanical Engineering, University of Maryland, College Park, MD 20742, USA., Agrawal A; Center for Devices and Radiological Health, Food and Drug Administration Silver Spring, MD 20993, USA.
Source: Advanced materials technologies [Adv Mater Technol] 2025 Sep 04; Vol. 10 (17).
Publication Type: Journal Article
Journal Info: Publisher: Wiley Blackwell Country of Publication: United States NLM ID: 101717732 Publication Model: Print Cited Medium: Internet ISSN: 2365-709X (Electronic) NLM ISO Abbreviation: Adv Mater Technol Subsets: PubMed not MEDLINE
Database: MEDLINE Ultimate
Description
ISSN:2365-709X
DOI:10.1002/admt.202401959